ASTM F1375-92(R2020) pdf free download

ASTM F1375-92(R2020) pdf free download.Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
1. Scope
1.1 This test method establishes a procedure for comparing the elemental composition of normal surfaces with any defects found on the surfaces of metal tubing, fittings, valves, or any metal component. 1.2 This test method applies to all steel surfaces of compo- nents such as tubings, connectors, regulators, and valves, regardless of size, style, or type. 1.3 Limitations: 1.3.1 This test method is intended for use by scanning electron microscope/energy dispersive x-ray spectrometer (SEM/EDX) operators with skill level typically achieved over a twelve-month period. 1.3.2 SEM used for this study should conform to those limitations outlined in Test Method F1372 and should have a minimum point-to-point resolution of 30 nm. 1.4 The values stated in SI units are to be regarded as the standard. The inch-pound units given in parentheses are for information only. 1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appro- priate safety, health, and environmental practices and deter- mine the applicability of regulatory limitations prior to use. Specific hazard statements are given in Section 6. 1.6 This international standard was developed in accor- dance with internationally recognized principles on standard- ization established in the Decision on Principles for the Development of International Standards, Guides and Recom- mendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
5. Apparatus
5.1 Materials: 5.1.1 Mounting Stubs, specific to the instrument used are required. 5.1.1.1 Samples shall not be coated with a conductive thin layer (for example, gold or carbon). 5.1.2 Conductive Paste/Tape, that will provide a conductive path. Use any means offixing the sample to a stub. Care should be taken not to contaminate the area of interest. 5.1.3 Adhesives, used to attach samples to sample stubs are to be vacuum stable. 5.2 Instrumentation: 5.2.1 Scanning Electron Microscope (SEM)—Any high resolution commercially available SEM with photographic capabilities of a 100 cm 2 image may be used for these analyses. 5.2.2 Instrument Operating Parameters , shall be as fol- lows: accelerating voltage, 20 KeV; final aperture size nominal 200 µm or less; and working distance and sample tilt, as appropriate to the EDX detector. 5.2.2.1 SEM instrument operating parameters shall be such that collection efficiency for the EDX spectrometer is opti- mized. 5.2.3 EDX Spectrometer, capable of full width half maxi- mum (FWHM) resolution of 170 eV or less (for MnKα), and capable of detecting all elements with an atomic number greater than or equal to that of sodium (Na). 5.2.4 Printer or Plotter, capable of accurate spectral repro- duction (linear-linear) is required.
6. Hazards
6.1 Observe all normal and acceptable precautions regard- ing use of high voltage, X-ray producing equipment. Observe standard and routine cryogenic handling procedures. 6.2 Use adhesives in such a manner that they do not contaminate the area of interest.
7. Sampling, Test Specimens, and Test Units
7.1 Sample Cutting and Mounting : 7.1.1 Use any mechanical cutting method that minimizes alteration of the surface. A dry, clean hacksaw is preferred. 7.1.2 After cutting, clean samples with a reagent grade solvent and rinse with a reagent grade isopropyl alcohol (IPA). Place prepared samples in a resealable non-outgassing con- tainer under nitrogen. 7.1.3 Mount the samples on the instrument stub. 7.2 Conduct sample preparation to ensure that the tempera- ture of the sample does not exceed 90°C (194°F). 7.3 Mount the samples onto SEM compatible mounts in a manner to avoid contamination of the surface to be analyzed. Non-X-ray generating substrates, such as graphite, are pre- ferred as mounting stubs.
8. Calibration
8.1 Calibrate and maintain instruments using standard labo- ratory practices and manufacturers’ recommendations. Cali- brate EDX spectrometers according to the manufacturer’s specifications so that the energy calibration falls within 6 1 channel. 8.2 Magnification for qualitative and quantitative analysis shall result in incident beam concentration on the surface anomaly, minimizing stray X-ray signal from the background.